Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction

✍ Scribed by A. Zolotaryov; A. Schramm; Ch. Heyn; A. Zozulya; W. Hansen

• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 818 KB
• Volume: 12
• Category: Article
• ISSN: 1369-8001
• DOI: 10.1016/j.mssp.2009.07.009