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Grazing Incidence In-plane Diffraction Measurement of In-plane Mosaic with Microfocus X-ray Tubes

✍ Scribed by M. S. Goorsky; B. K. Tanner

Publisher
John Wiley and Sons
Year
2002
Tongue
English
Weight
198 KB
Volume
37
Category
Article
ISSN
0232-1300

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Characterization of in-plane structures
Characterization of in-plane structures of vapor deposited thin-films of distyryl-oligothiophenes by grazing incidence x-ray diffractometry
✍ Noriyuki Yoshimoto; Keijyu Aosawa; Toshinori Taniswa; Kazuhiko Omote; J. Ackerma 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 518 KB

## Abstract The in‐plane structures of vapor deposited ultrathin films of distyryl‐oligothiophenes (DS‐2T) on SiO~2~ substrate were characterized by grazing incidence x‐ray diffractometry (GIXD). Two polymorphs, low‐temperature and high‐temperature phases, were identified, and the two dimensional u