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Glancing incidence EUV telescopes: analysis and comparison

✍ Scribed by Davila, Pam M. ;Saha, Timo T.


Book ID
115332696
Publisher
The Optical Society
Year
1984
Tongue
English
Weight
782 KB
Volume
23
Category
Article
ISSN
1559-128X

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πŸ“œ SIMILAR VOLUMES


Applications of Glancing Incidence X-Ray
✍ A. J. G. Leenaers; D. K. G. de Boer πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 481 KB πŸ‘ 1 views

In many technological applications layered materials have an increasing importance. Almost complete characterization of such materials can be achieved with glancing incidence x-ray analysis (GIXA). Within this technique, x-ray reΓ‘ectivity and angle-dependent x-ray Γ‘uorescence measurements are combin

Glancing-incidence and glancing-takeoff
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A thermally stable Ni-based ohmic contact is one of the most attractive contact materials for developing superior GaAs devices. To understand the interface reaction between an Ni thin film and a GaAs wafer, a combined grazing-incidence and grazing-takeoff x-ray fluorescence (GIT-XRF) method was appl

Synchrotron radiation-excited glancing i
✍ P. Kregsamer; Christina Streli; P. Wobrauschek; H. Gatterbauer; P. Pianetta; L. πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 144 KB

First results of depth profile and thin-film analysis by glancing incidence x-ray fluorescence analysis of low-Z elements (carbon to aluminum), usually not detectable by conventional instruments, were obtained by synchrotron radiation excitation (SSRL, Beamline III-4) and by a special energy-dispers