Glancing incidence EUV telescopes: analysis and comparison
β Scribed by Davila, Pam M. ;Saha, Timo T.
- Book ID
- 115332696
- Publisher
- The Optical Society
- Year
- 1984
- Tongue
- English
- Weight
- 782 KB
- Volume
- 23
- Category
- Article
- ISSN
- 1559-128X
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π SIMILAR VOLUMES
In many technological applications layered materials have an increasing importance. Almost complete characterization of such materials can be achieved with glancing incidence x-ray analysis (GIXA). Within this technique, x-ray reΓectivity and angle-dependent x-ray Γuorescence measurements are combin
A thermally stable Ni-based ohmic contact is one of the most attractive contact materials for developing superior GaAs devices. To understand the interface reaction between an Ni thin film and a GaAs wafer, a combined grazing-incidence and grazing-takeoff x-ray fluorescence (GIT-XRF) method was appl
First results of depth profile and thin-film analysis by glancing incidence x-ray fluorescence analysis of low-Z elements (carbon to aluminum), usually not detectable by conventional instruments, were obtained by synchrotron radiation excitation (SSRL, Beamline III-4) and by a special energy-dispers