𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Generation and characterization of thick silicon-on-insulator films

✍ Scribed by Tillack, B. ;Banisch, R. ;Richter, H. H.


Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
689 KB
Volume
107
Category
Article
ISSN
0031-8965

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Spectroscopic ellipsometry characterizat
✍ J. Vanhellemont; H.E. Maes πŸ“‚ Article πŸ“… 1990 πŸ› Elsevier Science 🌐 English βš– 570 KB

The wide applicability of spectroscopic ellipsometry (S/z) to characterize non-destructively silicon-on-insulator materials is illustrated with a number of case studies. SE allows the determination of not only the optical properties of single layers as a fimction of the wavelength but also their thi