This paper presents the possibilities and the main problems of thennography in VLSI circuits and power devices design and measurement. It is focused on emissivity correction, noise and other measuring difficulties. Advanced new methods of surveys with the use of thernlography are also presented. Com
Generalized image method with application to the thermal modeling of power devices and circuits
β Scribed by Rinaldi, N.
- Book ID
- 114539052
- Publisher
- IEEE
- Year
- 2002
- Tongue
- English
- Weight
- 323 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0018-9383
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