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Gate voltage and geometry dependence of the series resistance and of the carrier mobility in FinFET devices

✍ Scribed by P. Magnone; V. Subramanian; B. Parvais; A. Mercha; C. Pace; M. Dehan; S. Decoutere; G. Groeseneken; F. Crupi; S. Pierro


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
208 KB
Volume
85
Category
Article
ISSN
0167-9317

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