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Gate Capacitance Modeling and Diameter-Dependent Performance of Nanowire MOSFETs

✍ Scribed by Yeonghun Lee; Kakushima, K.; Natori, K.; Iwai, H.


Book ID
114620903
Publisher
IEEE
Year
2012
Tongue
English
Weight
811 KB
Volume
59
Category
Article
ISSN
0018-9383

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