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GaN (AlGaN/GaN) Si GaN substrates, SiC and SOI CMOS Hiten

Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 58 KB
Volume: 16
Category: Article
ISSN: 0961-1290
DOI: 10.1016/s0961-1290(03)00718-x

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✦ Synopsis

Technology: Microelectronics News Update Technology: Microelectronics BRIEFS MEMS tech transfer Cascade Microtech, wafer probe card and probe stations maker for lab-grade parametric testing of semi devices, has licensed RF measurement technology to Tokyo Seimitsu Co Ltd. Tech transfer will lead to faster, more accurate RF testing of advanced devices in production, including high-speed telecoms & wireless.

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