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Gain and defect bi-stability in radiation damaged silicon bipolar transistors

โœ Scribed by R.M. Fleming; C.H. Seager; D.V. Lang; E. Bielejec; J.M. Campbell


Book ID
103885226
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
173 KB
Volume
401-402
Category
Article
ISSN
0921-4526

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