Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists

✍ Scribed by Dong ZhiLi

• Publisher: CRC Press
• Year: 2022
• Tongue: English
• Leaves: 287
• Series: Advances in Materials Science and Engineering
• Category: Library

✦ Synopsis

The structure–property relationship is a key topic in materials science and engineering. To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures.

• Introduces fundamentals of crystallography

• Covers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methods

• Describes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrasts

• Discusses applications of HRTEM in materials research

• Explains concepts used in XRD and TEM lab training

Based on the author’s course lecture notes, this text guides materials science and engineering students with minimal reliance on advanced mathematics. It will also appeal to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering.

✦ Table of Contents

Cover
Half Title
Series Page
Title Page
Copyright Page
Table of Contents
Acknowledgments
Preface
Author
Symbols Used in This Book
Introduction
References
Part I: Introduction to Crystallography
References
Chapter 1: Periodicity of Crystals and Bravais Lattices
1.1 Crystals, Lattices and Basis
1.2 Unit Cell Types, Crystal Systems and Bravais Lattices
1.3 Rhombohedral Cells and Non-Rhombohedral Cells in Trigonal Systems
1.4 Miller–Bravais Indices in Hexagonal Systems
Summary
References
Chapter 2: Symmetry of Crystals, Point Groups and Space Groups
2.1 Symmetry Elements and Representations
2.2 Combinations of Symmetry Elements
2.3 Point Groups for the Cubic System
2.4 Thirty-two Crystallographic Point Groups and 230 Space Groups
Summary
References
Chapter 3: Reciprocal Lattices
3.1 Definition and Lattice Parameter Relationships
3.2 Some Important Properties of the Reciprocal Lattice and Associated Calculations
Summary
References
Chapter 4: Examples of Crystal Structure Representation
Summary
References
Part II: X-ray Diffraction of Materials
References
Chapter 5: Geometry of X-ray Diffraction
5.1 Bragg’s Equation
5.2 Ewald Sphere Construction and the Vector form of Bragg’s Law
Summary
Reference
Chapter 6: The Intensity of Diffracted X-ray Beams
6.1 Scattering of an X-ray by an Electron
6.2 Scattering by an Atom
6.3 Scattering by a Unit Cell
6.4 Further Discussion on Structure Factor
6.5 Diffraction by a Small Crystal
Summary
References
Chapter 7: Experimental Methods and the Powder X-Ray Diffractometer
Summary
References
Chapter 8: Rietveld Refinement of Powder X-Ray Diffraction Patterns
Summary
References
Part III: Transmission Electron Microscopy of Materials
References
Chapter 9: Atomic Scattering Factors for Electrons and X-rays
9.1 Atomic Scattering Factor for an Electron
9.2 Relationships between the Atomic Scattering Factor for X-Rays and Electrons
Summary
References
Chapter 10: Electron Diffraction in Transmission Electron Microscopes
10.1 Geometry of eLectron Diffraction in TEMs
10.2 Intensity of diffracted beam
Summary
References
Chapter 11: Diffraction Contrast
11.1 Two-Beam Dynamical Theory
11.2 Discussion of Diffraction Contrast
11.2.1 Amplitude of the Diffracted Beam and the Formation of Thickness Fringes and Bend Contours
11.2.2 Discussion of the Two Bloch Waves
11.2.3 Discussion on the Contrast of the Crystal Defects
Summary
References
Chapter 12: Phase Contrast
12.1 Interference of Two Beams
12.2 Projected Potential of Thin Crystals and HRTEM Images
12.3 HRTEM Image Simulation
12.4 Lens Aberrations and Aberration Corrections
12.5 Example of Application of HRTEM to Materials Research
Summary
References
Appendix 1: Fourier Series, Fourier Transforms, and Associated Equations
References
Appendix 2: Nearly Free Electron Approximation and the Band Structure of Crystals
References
Index