Transmission Electron Microscopy [II - Diffraction]
✍ Scribed by D. Williams, C. Carter
- Publisher
- Plenum
- Year
- 1996
- Tongue
- English
- Leaves
- 164
- Category
- Library
No coin nor oath required. For personal study only.
✦ Subjects
Физика;Практикумы, экспериментальная физика и физические методы исследования;
📜 SIMILAR VOLUMES
This book is a practical guide to electron diffraction in the transmission electron microscope (TEM). Case studies and examples are used to provide an invaluable introduction to the subject for those new to the technique. The book explains the basic methods used to obtain diffraction patterns with t
<p>This text is a companion volume to <i><b>Transmission Electron Microscopy: A Textbook for Materials Science</b></i> by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than
<p>This volume expands and updates the coverage in the authors' popular 1992 book, <i>Electron Microdiffraction</i>. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microsco
Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope, SEM, at several nanometers. The imaging resolution of the TEM, howe