Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience

✍ Scribed by Jian Min Zuo, John C.H. Spence (auth.)

• Publisher: Springer-Verlag New York
• Year: 2017
• Tongue: English
• Leaves: 741
• Edition: 1
• Category: Library

✦ Synopsis

This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.

✦ Table of Contents

Front Matter....Pages i-xxvi
Introduction and Historical Background....Pages 1-18
Electron Waves and Wave Propagation....Pages 19-47
The Geometry of Electron Diffraction Patterns....Pages 49-75
Kinematical Theory of Electron Diffraction....Pages 77-100
Dynamical Theory of Electron Diffraction for Perfect Crystals....Pages 101-141
Electron Optics....Pages 143-164
Lens Aberrations and Aberration Correction....Pages 165-191
Electron Sources....Pages 193-206
Electron Detectors....Pages 207-229
Instrumentation and Experimental Techniques....Pages 231-295
Crystal Symmetry....Pages 297-346
Crystal Structure and Bonding....Pages 347-401
Diffuse Scattering....Pages 403-440
Atomic Resolution Electron Imaging....Pages 441-499
Imaging and Characterization of Crystal Defects....Pages 501-552
Strain Measurements and Mapping....Pages 553-580
Structure of Nanocrystals, Nanoparticles, and Nanotubes....Pages 581-652
Back Matter....Pages 653-729

✦ Subjects

Characterization and Evaluation of Materials;Optics, Lasers, Photonics, Optical Devices;Nanochemistry;Nanoscale Science and Technology;Nanotechnology;Solid State Physics