๐”– Scriptorium
โœฆ   LIBER   โœฆ

๐Ÿ“

Diffraction and Imaging Techniques in Material Science. Electron Microscopy

โœ Scribed by S Amelinckx (Eds.)


Publisher
North-Holland Publ. Comp
Year
1978
Tongue
English
Leaves
451
Edition
2., rev. ed
Category
Library

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โœฆ Table of Contents


Content:
Front Matter, Page iii
Copyright, Page iv
PREFACE TO THE FIRST EDITION, Page v, The Organizing Committee
PREFACE TO THE SECOND EDITION, Page vi, The Editors
GENERAL REVIEW OF THE EXPERIMENTAL METHODS FOR THE DETERMINATION OF ATOMIC STRUCTURES, Pages 3-6, A. GUINIER
KINEMATICAL THEORY OF ELECTRON DIFFRACTION, Pages 9-41, R. GEVERS
DYNAMICAL THEORY OF ELECTRON DIFFRACTION, Pages 43-106, M.J. WHELAN
THE STUDY OF PLANAR INTERFACES BY MEANS OF ELECTRON MICROSCOPY, Pages 107-151, S. AMELINCKX, J. Van LANDUYT
THE WEAK-BEAM METHOD OF ELECTRON MICROSCOPY, Pages 153-183, D.J.H. COCKAYNE
IDENTIFICATION OF SMALL DEFECT CLUSTERS IN PARTICLE-IRRADIATED CRYSTALS BY MEANS OF TRANSMISSION ELECTRON MICROSCOPY, Pages 185-215, M. WILKENS
SOME APPLICATIONS OF TRANSMISSION ELECTRON MICROSCOPY TO PHASE TRANSITIONS, Pages 217-249, G. THOMAS
MARTENSITIC TRANSFORMATIONS: ELECTRON MICROSCOPY AND DIFFRACTION STUDIES, Pages 251-314, C.M. WAYMAN
COMPUTED ELECTRON MICROGRAPHS AND THEIR USE IN DEFECT IDENTIFICATION, Pages 315-353, P. HUMBLE
DIRECT STRUCTURE IMAGING IN ELECTRON MICROSCOPY, Pages 355-396, D. VAN DYCK
KIKUCHI ELECTRON DIFFRACTION AND APPLICATIONS, Pages 399-427, G. THOMAS
STUDY OF SUBSTITUTION ORDER-DISORDER BY MEANS OF X-RAY AND ELECTRON DIFFRACTION, Pages 429-453, R. DE RIDDER
SUBJECT INDEX TO VOLUMES I AND II, Pages xi-xvii


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