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Fundamental quantification procedure for total reflection X-ray fluorescence spectra analysis and elements determination

✍ Scribed by D. Wȩgrzynek; B. Hołyńska


Book ID
114254449
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
252 KB
Volume
52
Category
Article
ISSN
0584-8547

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## Total Reflection X-ray Fluorescence (TXRF) is a variant of Energy dispersive X-ray Fluorescence (EDXRF). It is a comparatively new method of trace element analysis and finds its application in various research areas of material development and processing. The versatility of TXRF is due to (i.) r