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Fully scaled 0.5 μm MOS cicuits by synchroton X-ray lithography: Resist systems and line width control

✍ Scribed by D. Seeger; K. Kwietniak; D. Crockatt; A. Wilson; J. Warlaumont


Book ID
107920370
Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
903 KB
Volume
9
Category
Article
ISSN
0167-9317

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