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Fringe field corrections for capacitors on thin dielectric layers

✍ Scribed by C.H. Séquin


Book ID
103392057
Publisher
Elsevier Science
Year
1971
Tongue
English
Weight
233 KB
Volume
14
Category
Article
ISSN
0038-1101

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Characteristic parameters for CPWs on a
✍ Ji-Xiang Zhao 📂 Article 📅 2005 🏛 John Wiley and Sons 🌐 English ⚖ 65 KB

## Abstract In this paper, approximate analytical expressions for characteristic parameters of CPWs on a very thin dielectric layer are given. The “crowding phenomenon” that occurs during the process of conformal mapping is overcome. Combining these expressions with the partial‐capacitance method,