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Characteristic parameters for CPWs on a very thin dielectric layer

✍ Scribed by Ji-Xiang Zhao

Book ID: 102518225
Publisher: John Wiley and Sons
Year: 2005
Tongue: English
Weight: 65 KB
Volume: 45
Category: Article
ISSN: 0895-2477
DOI: 10.1002/mop.20783

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✦ Synopsis

Abstract

In this paper, approximate analytical expressions for characteristic parameters of CPWs on a very thin dielectric layer are given. The “crowding phenomenon” that occurs during the process of conformal mapping is overcome. Combining these expressions with the partial‐capacitance method, the characteristic parameters for CPWs on a multidielectric layered substrate are computed and are found to agree well with the test data. © 2005 Wiley Periodicals, Inc. Microwave Opt Technol Lett 45: 240–241, 2005; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20783

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