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Fracture studies in silicon crystals by X-Ray pendellösung fringes and double-crystal diffractometry

✍ Scribed by Weissmann, S. ;Tsunekawa, Y. ;Kannan, V. C.


Book ID
112811554
Publisher
Springer-Verlag
Year
1973
Weight
744 KB
Volume
4
Category
Article
ISSN
0026-086X

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