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Study of thermal behaviour of oxygen in silicon crystals by analysis of X-ray Pendellösung fringes

✍ Scribed by Li, M. ;Mai, Z.-H. ;Cui, S.-F.


Book ID
114513782
Publisher
International Union of Crystallography
Year
1994
Tongue
English
Weight
855 KB
Volume
50
Category
Article
ISSN
0108-7673

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