Forward gated-diode method for directly measuring stress-induced interface traps in NMOSFET/SOI

✍ Scribed by Aihua Huang; Jin He; Xing Zhang; Ru Huang; Yangyuan Wang; Shan Yu; Lin Jia

• Book ID: 107502339
• Publisher: SP Science Press
• Year: 2002
• Tongue: English
• Weight: 258 KB
• Volume: 19
• Category: Article
• ISSN: 0217-9822
• DOI: 10.1007/s11767-002-0019-x