Forward gated-diode method for extracting hot-carrier-stress-induced back interface traps in SOI/NMOSFETs

✍ Scribed by Jin He; Xing Zhang; Ru Huang; Yangyuan Wang

• Book ID: 107502382
• Publisher: SP Science Press
• Year: 2002
• Tongue: English
• Weight: 318 KB
• Volume: 19
• Category: Article
• ISSN: 0217-9822
• DOI: 10.1007/s11767-002-0062-7