Photoemission study of ultra-thin vanadi
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P Pervan; T Valla; M Milun
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Article
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1998
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Elsevier Science
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English
โ 300 KB
The electronic properties of ultra-thin vanadium films grown on the Cu(100) surface are studied by means of angular photoemission spectroscopy (ARUPS). Vanadium films with nominal film thickens of 4 ML appear to have fully developed valence band characteristic for the bulk vanadium. Influence of hyd