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XPS and AFM characterization of a vanadium oxide film on TiO2(100) surface

โœ Scribed by G. Chiarello; R. Barberi; A. Amoddeo; L.S. Caputi; E. Colavita

Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
485 KB
Volume
99
Category
Article
ISSN
0169-4332

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