Preparation and characterization of patterned copper sulfide thin films on n-type TiO2 film surfaces

✍ Scribed by Yongjuan Lu; Gewen Yi; Junhong Jia; Yongmin Liang

• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 718 KB
• Volume: 256
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2010.05.072

✦ Synopsis

Micro-arrayed patterns of p-type copper sulfide (Cu x S) thin films with positive and negative features were deposited onto the surfaces of n-type TiO 2 semiconductor films via a selective nucleation and growth process from aqueous solution. The surface functional molecules of the UV photo-oxidised patterned SAMs were utilized to direct the nucleation and growth of Cu x S crystallites. The resultant Cu x S/TiO 2 composite films with negative and positive Cu x S patterns on the TiO 2 film surface were investigated using SEM, XRD, XPS and a 3D Surface Profiler. It is demonstrated that regular and compact patterned films of Cu 2 S crystallites had been deposited onto the n-type TiO 2 surface, with sharp edges demarcating the boundaries between the patterned Cu 2 S region and the TiO 2 film region. The UV-vis spectra for three Cu 2 S/TiO 2 films exhibit a wide absorption between 300 nm and 450 nm. The maximum wavelength differences in the spectra of Cu 2 S/TiO 2 films and TiO 2 film were attributed to the added absorption of Cu 2 S films at 302 nm and the unchanged adsorption of TiO 2 films. The absorption intensities of the Cu 2 S/TiO 2 films could be varied in the UV-vis range using the Cu 2 S patterned features (positive, negative).