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Formation of high-conductivity NiSi2 layers on Si at zero-mismatch temperature by high-current Ni-ion implantation

โœ Scribed by K.Y. Gao; B.X. Liu


Book ID
106023491
Publisher
Springer
Year
1999
Tongue
English
Weight
92 KB
Volume
68
Category
Article
ISSN
1432-0630

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