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Fluence dependence of the interband critical points in ion-implanted silicon

✍ Scribed by M.A El-Sherbiny; H.H El-Bahnasawy; M.M El-Ocker


Book ID
114164027
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
518 KB
Volume
168
Category
Article
ISSN
0168-583X

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