Review of the wafer stage for nanoimprin
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Hongbo Lan; Yucheng Ding; Hongzhong Liu; Bingheng Lu
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Article
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2007
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Elsevier Science
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English
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Nanoimprint lithography (NIL) has been flagged as one of the most promising processes for next generation lithography due to its simplicity, low cost, high replication fidelity and relatively high throughput. As a key subsystem, the ultra-precision positioning substrate stage plays a particularly cr