Flicker noise in CMOS transistors from subthreshold to strong inversion at various temperatures

✍ Scribed by Jimmin Chang; Abidi, A.A.; Viswanathan, C.R.

• Book ID: 114535917
• Publisher: IEEE
• Year: 1994
• Tongue: English
• Weight: 693 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.333812