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Body bias dependence of 1/f noise in NMOS transistors from deep-subthreshold to strong inversion

✍ Scribed by Namkyu Park; O, K.K.

Book ID: 114538666
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 114 KB
Volume: 48
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.918249

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