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First silicide formed by reaction of Ni(13%Pt) films with Si(1 0 0): Nature and kinetics by in-situ X-ray reflectivity and diffraction

✍ Scribed by M. Putero; L. Ehouarne; E. Ziegler; D. Mangelinck

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First silicide formed by reaction of Ni(13%Pt) films with Si(1&#xa0;0&#xa0;0): Nature and kinetics by in-situ X-ray reflectivity and diffraction