First-principles study on electronic structure of Si/SiO2 interface—Effect of interface defects on local charge density

✍ Scribed by Katsuhiro Kutsuki; Tomoya Ono; Kikuji Hirose

• Book ID: 108275805
• Publisher: Institute of Physics and National Institute of Materials Science
• Year: 2007
• Tongue: English
• Weight: 546 KB
• Volume: 8
• Category: Article
• ISSN: 1468-6996
• DOI: 10.1016/j.stam.2007.01.008