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First-principles study of the segregation of boron dopants near the interface between crystalline Si and amorphous SiO2

✍ Scribed by Young Jun Oh; Hyeon-Kyun Noh; K.J. Chang

Book ID: 116833926
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 994 KB
Volume: 407
Category: Article
ISSN: 0921-4526
DOI: 10.1016/j.physb.2011.08.050

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