𝔖 Bobbio Scriptorium

✦ LIBER ✦

Fine-Grain SEU Mitigation for FPGAs Using Partial TMR

✍ Scribed by Pratt, Brian; Caffrey, Michael; Carroll, James F.; Graham, Paul; Morgan, Keith; Wirthlin, Michael

Book ID: 119976896
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 263 KB
Volume: 55
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2008.2000852

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2009 15th IEEE International On-Li

[IEEE 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009) - Sesimbra-Lisbon, Portugal (2009.06.24-2009.06.26)] 2009 15th IEEE International On-Line Testing Symposium - Evaluating large grain TMR and selective partial reconfiguration for soft error mitigation in SRAM-based FPGAs

✍ Azambuja, Jose Rodrigo; Sousa, Fernando; Rosa, Lucas; Kastensmidt, Fernanda Lima 📂 Article 📅 2009 🏛 IEEE ⚖ 649 KB

[IEEE 22nd IEEE International Symposium

[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - TMR and Partial Dynamic Reconfiguration to mitigate SEU faults in FPGAs

✍ Bolchini, Cristiana; Miele, Antonio; Santambrogio, Marco D. 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 277 KB