Fin Width and Bias Dependence of the Response of Triple-Gate MOSFETs to Total Dose Irradiation

✍ Scribed by Song, Jae-Joon; Choi, Bo Kyoung; Zhang, En Xia; Schrimpf, Ronald D.; Fleetwood, Daniel M.; Park, Chan-Hoon; Jeong, Yoon-Ha; Kim, Ohyun

• Book ID: 111916979
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 829 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.2011.2168977