A method to determine the gate bias-dependent and gate bias-independent components of MOSFET series resistance from S-parameters

✍ Scribed by Torres-Rios, E.; Torres-Torres, R.; Valdovinos-Fierro, G.; Gutierrez-D, E.A.

• Book ID: 114618168
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 122 KB
• Volume: 53
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2006.870328