A new method to determine the source resistance of FET from measured S-parameters under active-bias conditions

✍ Scribed by Sommer, V.

• Book ID: 114552262
• Publisher: IEEE
• Year: 1995
• Tongue: English
• Weight: 725 KB
• Volume: 43
• Category: Article
• ISSN: 0018-9480
• DOI: 10.1109/22.372093