A new extraction method to determine bias-dependent source series resistance in GaAs FET's

✍ Scribed by Chung-Hwan Kim; Kyung-Sik Yoon; Jeon-Wook Yang; Jin-Hee Lee; Chul-Soon Park; Jae-Jin Lee; Kwang-Eui Pyun

• Book ID: 114553282
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 252 KB
• Volume: 46
• Category: Article
• ISSN: 0018-9480
• DOI: 10.1109/22.709464