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Film thickness effect on the properties of interconnection between YBCO and Si for superconductor and semiconductor integration

✍ Scribed by Y.S Jeong; J.H Park; D.S Eun; S.Y Lee; C.H Kim; T.S Hahn; J.Y Kim; I.-S Yang


Book ID
108478656
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
282 KB
Volume
5
Category
Article
ISSN
0964-1807

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