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Film Thickness and Refractive Indices of Dielectric Films on Dielectric Substrates

โœ Scribed by SPARROW, E. M.; ECKERT, E. R. G.; RUIZ-URBIETA, M.


Book ID
115382828
Publisher
Optical Society of America
Year
1971
Weight
627 KB
Volume
61
Category
Article
ISSN
0030-3941

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## Abstract A technique for the characterization of microwave dielectric properties of high dielectric constant thick films at room temperature is proposed, using multilayered coplanar waveguide transmission lines with high dielectric constant thick films deposited over the lines.Besides the simpli