✦ LIBER ✦

Filament Conduction and Reset Mechanism in NiO-Based Resistive-Switching Memory (RRAM) Devices

✍ Scribed by Russo, U.; Ielmini, D.; Cagli, C.; Lacaita, A.L.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Modeling of Set/Reset Operations in NiO-

✍ Cagli, C.; Nardi, F.; Ielmini, D. 📂 Article 📅 2009 🏛 IEEE 🌐 English ⚖ 782 KB

Self-Accelerated Thermal Dissolution Mod

✍ Russo, U.; Ielmini, D.; Cagli, C.; Lacaita, A.L. 📂 Article 📅 2009 🏛 IEEE 🌐 English ⚖ 640 KB

Electrical conduction and bipolar switch

✍ Chen, Kai-Huang; Liao, Chin-Hsiung; Tsai, Jen-Hwan; Wu, Sean 📂 Article 📅 2012 🏛 Springer 🌐 English ⚖ 650 KB

Multiple Memory States in Resistive Swit

✍ Balatti, S.; Larentis, S.; Gilmer, D. C.; Ielmini, D. 📂 Article 📅 2013 🏛 John Wiley and Sons 🌐 English ⚖ 810 KB

Collective Motion of Conducting Filament

✍ Kyung Min Kim; Seul Ji Song; Gun Hwan Kim; Jun Yeong Seok; Min Hwan Lee; Jung Ho 📂 Article 📅 2011 🏛 John Wiley and Sons 🌐 English ⚖ 835 KB

Mechanism of negative resistance and fil

✍ Duchene, J. ;Adam, G. ;Augibr, D. 📂 Article 📅 1971 🏛 John Wiley and Sons 🌐 English ⚖ 265 KB