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Field ion microscope and atom-probe analysis of Ni overlayers on thin films of Rh2O3

✍ Scribed by G.L. Kellogg

Book ID: 104197949
Publisher: Elsevier Science
Year: 1991
Weight: 72 KB
Volume: 257
Category: Article
ISSN: 0167-2584
DOI: 10.1016/0167-2584(91)91084-a

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