✦ LIBER ✦
Time-of-flight atom-probe field ion microscope analysis of thin films: Surface segregation of alloys and early stages of silicide formation
✍ Scribed by T.T. Tsong
- Publisher
- Elsevier Science
- Year
- 1983
- Weight
- 565 KB
- Volume
- 218
- Category
- Article
- ISSN
- 0167-5087
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