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Fault tolerance in systems design in VLSI using data compression under constraints of failure probabilities

✍ Scribed by Das, S.R.; Ramamoorthy, C.V.; Assaf, M.H.; Petriu, E.M.; Wen-Ben Jone

Book ID: 114545106
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 496 KB
Volume: 50
Category: Article
ISSN: 0018-9456
DOI: 10.1109/19.982974

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