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Fault tolerance in N-MOS random access memories with dynamic redundancy methods

✍ Scribed by R.Venkatapathi Naidu; S. Mahapatra

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 620 KB
Volume: 28
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(88)90350-2

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