Fault-tolerance considerations for redundant binary-tree-dynamic random-access-memory (RAM) chips: Ciciani, BIEEE Trans. Reliab. Vol 41 No 1 (March 1992) pp 139–148

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 115 KB
• Volume: 17
• Category: Article
• ISSN: 0141-9331
• DOI: 10.1016/0141-9331(93)90098-r