Fault-tolerance considerations for redundant binary-tree dynamic random-access-memory (RAM) chips : Bruno Ciciani. IEEE Trans. Reliab. 41, 139 (1992)

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 125 KB
• Volume: 32
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(92)90359-s