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Fault simulation of parametric bridging faults in CMOS IC's

✍ Scribed by Dalpasso, M.; Favalli, M.; Olivo, P.; Ricco, B.


Book ID
119777703
Publisher
IEEE
Year
1993
Tongue
English
Weight
854 KB
Volume
12
Category
Article
ISSN
0278-0070

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Dynamic effects in the detection of brid
✍ Michele Favalli; Piero Olivo; Bruno RiccΓ² πŸ“‚ Article πŸ“… 1992 πŸ› Springer US 🌐 English βš– 600 KB

Dynamic effects in the detection of bridging faults in CMOS circuits are taken into account showing that a test vector designed to detect a bridging may be invalidated because of the increased propagation delay of the faulty signal. To overcome this problem, it is shown that a sequence of two test v