✦ LIBER ✦

Fast flatness measurement

Publisher: Elsevier Science
Year: 1981
Tongue: English
Weight: 159 KB
Volume: 3
Category: Article
ISSN: 0141-6359
DOI: 10.1016/0141-6359(81)90102-1

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Some results of flatness measurement

✍ W. de Bruin; J. Meijer 📂 Article 📅 1981 🏛 Elsevier Science 🌐 English ⚖ 935 KB

Optical flatness measurement technique f

Optical flatness measurement technique for glass substrates

✍ Hisatoshi Fujiwara; Yukitoshi Otani; Toru Yoshizawa 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 138 KB

Round-robin test for flatness measuremen

Round-robin test for flatness measurement of GaAs wafers

📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 418 KB

Part II1: LTV and PLTV I Due to increasing market demands for GaAs substrates worldwide, improvements in physical characteristics such as warp, flatness, local thickness variation (LTV) and other parameters are required. III-Vs Review concludes its three-part series covering the round-robin testing

Fast displacement measurement

📂 Article 📅 1981 🏛 Elsevier Science 🌐 English ⚖ 208 KB

Flatness Criteria

✍ J. Kollar 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 528 KB

Flatness Tester

📂 Article 📅 1979 🏛 Elsevier Science 🌐 English ⚖ 126 KB