𝔖 Bobbio Scriptorium

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Failure mechanisms in beam lead semiconductors : U. C. Brown and J. R. Sim. Proc. Electron. Components Conf. Arlington, Va., May 16–18, 1977. p. 188

Publisher: Elsevier Science
Year: 1977
Tongue: English
Weight: 97 KB
Volume: 16
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(77)90457-7

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