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Testing of thick film technology in ionizing radiation environments : D. R. Johnson, R. E. Knutson and J. T. Grissom. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977). p. 524

Publisher: Elsevier Science
Year: 1978
Tongue: English
Weight: 127 KB
Volume: 17
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(78)90679-0

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